White Paper | Avoiding Damages to SPDs from Electrical HiPot Testing
This document describes how Dielectric Withstanding Voltage testing, also known as “High Potential” or “HiPot” testing, can affect Surge Protective Devices (SPDs) that are present in a system. It also describes how HiPot test results can be affected by SP
Date:
01 Feb 2021| Type:
White paper
Languages:
English| Version:
1.0
Document Reference:
SPD-WP-50022-SPDHIPOTDMG
Files
File Name
WP-50022_SPD-damage_from_HiPot_testing.pdf
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