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White Paper | Avoiding Damages to SPDs from Electrical HiPot Testing

This document describes how Dielectric Withstanding Voltage testing, also known as “High Potential” or “HiPot” testing, can affect Surge Protective Devices (SPDs) that are present in a system. It also describes how HiPot test results can be affected by SP

Date: 01 Feb 2021 | Type: White paper
Languages: English | Version: 1.0
Document Reference: SPD-WP-50022-SPDHIPOTDMG

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File Name
WP-50022_SPD-damage_from_HiPot_testing.pdf
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